Conventional approaches to analysis of thermographic NDT data are based on visual or computer analysis of the images from the infrared camera. These methods are often difficult to interpret and limited in their ability to image deep or subtle features, or perform quantitative measurement.

TWI’s patented Thermographic Signal Reconstruction (TSR) method addresses these limitations, and allows an unprecedented degree of sensitivity, depth range and resolution of subsurface defects. The introduction of TSR has played a significant role in the growth of thermography in real-world manufacturing and in-service inspection applications.

• Increase spatial resolution
• Reduce blurring of deep features
• Increase signal to noise
• Order of magnitude file size reduction
• Automated defect recognition
• Reference-free measurement and defect detection